Yoshino K. Fukai, Kenji Kurishima, Norihide Kashio, Minoru Ida, Shoji Yamahata, Takatomo Enoki. Emitter-metal-related degradation in InP-based HBTs operating at high current density and its suppression by refractory metal. Microelectronics Reliability, 49(4):357-364, 2009. [doi]
@article{FukaiKKIYE09,
title = {Emitter-metal-related degradation in InP-based HBTs operating at high current density and its suppression by refractory metal},
author = {Yoshino K. Fukai and Kenji Kurishima and Norihide Kashio and Minoru Ida and Shoji Yamahata and Takatomo Enoki},
year = {2009},
doi = {10.1016/j.microrel.2009.01.005},
url = {http://dx.doi.org/10.1016/j.microrel.2009.01.005},
tags = {rule-based},
researchr = {https://researchr.org/publication/FukaiKKIYE09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {4},
pages = {357-364},
}