Hiroshi Fuketa, Masanori Hashimoto, Yukio Mitsuyama, Takao Onoye. Correlation verification between transistor variability model with body biasing and ring oscillation frequency in 90nm subthreshold circuits. In Vijaykrishnan Narayanan, C. P. Ravikumar, Jörg Henkel, Ali Keshavarzi, Vojin G. Oklobdzija, Barry M. Pangrle, editors, Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008, Bangalore, India, August 11-13, 2008. pages 3-8, ACM, 2008. [doi]
@inproceedings{FuketaHMO08,
title = {Correlation verification between transistor variability model with body biasing and ring oscillation frequency in 90nm subthreshold circuits},
author = {Hiroshi Fuketa and Masanori Hashimoto and Yukio Mitsuyama and Takao Onoye},
year = {2008},
doi = {10.1145/1393921.1393929},
url = {http://doi.acm.org/10.1145/1393921.1393929},
researchr = {https://researchr.org/publication/FuketaHMO08},
cites = {0},
citedby = {0},
pages = {3-8},
booktitle = {Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008, Bangalore, India, August 11-13, 2008},
editor = {Vijaykrishnan Narayanan and C. P. Ravikumar and Jörg Henkel and Ali Keshavarzi and Vojin G. Oklobdzija and Barry M. Pangrle},
publisher = {ACM},
isbn = {978-1-60558-109-5},
}