Hiroshi Fuketa, Masanori Hashimoto, Yukio Mitsuyama, Takao Onoye. Correlation verification between transistor variability model with body biasing and ring oscillation frequency in 90nm subthreshold circuits. In Vijaykrishnan Narayanan, C. P. Ravikumar, Jörg Henkel, Ali Keshavarzi, Vojin G. Oklobdzija, Barry M. Pangrle, editors, Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008, Bangalore, India, August 11-13, 2008. pages 3-8, ACM, 2008. [doi]
Abstract is missing.