Correlations between well potential and SEUs measured by well-potential perturbation detectors in 65nm - researchr publication authors

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Jun Furuta, Ryosuke Yamamoto, Kazutoshi Kobayashi, Hidetoshi Onodera. Correlations between well potential and SEUs measured by well-potential perturbation detectors in 65nm. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2011, Jeju, South Korea, November 14-16, 2011. pages 209-212, IEEE, 2011. [doi]

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