Jun Furuta, Ryosuke Yamamoto, Kazutoshi Kobayashi, Hidetoshi Onodera. Correlations between well potential and SEUs measured by well-potential perturbation detectors in 65nm. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2011, Jeju, South Korea, November 14-16, 2011. pages 209-212, IEEE, 2011. [doi]
@inproceedings{FurutaYKO11,
title = {Correlations between well potential and SEUs measured by well-potential perturbation detectors in 65nm},
author = {Jun Furuta and Ryosuke Yamamoto and Kazutoshi Kobayashi and Hidetoshi Onodera},
year = {2011},
doi = {10.1109/ASSCC.2011.6123639},
url = {http://dx.doi.org/10.1109/ASSCC.2011.6123639},
researchr = {https://researchr.org/publication/FurutaYKO11},
cites = {0},
citedby = {0},
pages = {209-212},
booktitle = {IEEE Asian Solid-State Circuits Conference, A-SSCC 2011, Jeju, South Korea, November 14-16, 2011},
publisher = {IEEE},
isbn = {978-1-4577-1784-0},
}