Deep Sub-100 nm Design Challenges

Tohru Furuyama. Deep Sub-100 nm Design Challenges. In Ninth Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD 2006), 30 August - 1 September 2006, Dubrovnik, Croatia. pages 9-16, IEEE Computer Society, 2006. [doi]

Authors

Tohru Furuyama

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