Deep Sub-100 nm Design Challenges

Tohru Furuyama. Deep Sub-100 nm Design Challenges. In Ninth Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD 2006), 30 August - 1 September 2006, Dubrovnik, Croatia. pages 9-16, IEEE Computer Society, 2006. [doi]

@inproceedings{Furuyama06,
  title = {Deep Sub-100 nm Design Challenges},
  author = {Tohru Furuyama},
  year = {2006},
  doi = {10.1109/DSD.2006.37},
  url = {http://doi.ieeecomputersociety.org/10.1109/DSD.2006.37},
  tags = {design},
  researchr = {https://researchr.org/publication/Furuyama06},
  cites = {0},
  citedby = {0},
  pages = {9-16},
  booktitle = {Ninth Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD 2006), 30 August - 1 September 2006, Dubrovnik, Croatia},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-2609-8},
}