Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip - researchr publication authors

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Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus. Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip. In 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 7-9 July 2003, Kos Island, Greece. pages 183, IEEE Computer Society, 2003. [doi]

This author has not been identified. Look up 'Christian Galke' in GoogleThis author has not been identified. Look up 'Marcus Grabow' in GoogleThis author has not been identified. Look up 'Heinrich Theodor Vierhaus' in Google

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