Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus. Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip. In 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 7-9 July 2003, Kos Island, Greece. pages 183, IEEE Computer Society, 2003. [doi]
@inproceedings{GalkeGV03,
title = {Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip},
author = {Christian Galke and Marcus Grabow and Heinrich Theodor Vierhaus},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/iolts/2003/1968/00/19680183abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/GalkeGV03},
cites = {0},
citedby = {0},
pages = {183},
booktitle = {9th IEEE International On-Line Testing Symposium (IOLTS 2003), 7-9 July 2003, Kos Island, Greece},
publisher = {IEEE Computer Society},
isbn = {0-7695-1968-7},
}