Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip

Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus. Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip. In 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 7-9 July 2003, Kos Island, Greece. pages 183, IEEE Computer Society, 2003. [doi]

Abstract

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