Bayesian Inference on Introduced General Region: An Efficient Parametric Yield Estimation Method for Integrated Circuits

Zhengqi Gao, Zihao Chen, Jun Tao 0001, Yangfeng Su, Dian Zhou, Xuan Zeng 0001. Bayesian Inference on Introduced General Region: An Efficient Parametric Yield Estimation Method for Integrated Circuits. In ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, Tokyo, Japan, January 18-21, 2021. pages 892-897, ACM, 2021. [doi]

Authors

Zhengqi Gao

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Zihao Chen

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Jun Tao 0001

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Yangfeng Su

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Dian Zhou

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Xuan Zeng 0001

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