Zhengqi Gao, Zihao Chen, Jun Tao 0001, Yangfeng Su, Dian Zhou, Xuan Zeng 0001. Bayesian Inference on Introduced General Region: An Efficient Parametric Yield Estimation Method for Integrated Circuits. In ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, Tokyo, Japan, January 18-21, 2021. pages 892-897, ACM, 2021. [doi]
@inproceedings{GaoC0SZ021,
title = {Bayesian Inference on Introduced General Region: An Efficient Parametric Yield Estimation Method for Integrated Circuits},
author = {Zhengqi Gao and Zihao Chen and Jun Tao 0001 and Yangfeng Su and Dian Zhou and Xuan Zeng 0001},
year = {2021},
doi = {10.1145/3394885.3431572},
url = {https://doi.org/10.1145/3394885.3431572},
researchr = {https://researchr.org/publication/GaoC0SZ021},
cites = {0},
citedby = {0},
pages = {892-897},
booktitle = {ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, Tokyo, Japan, January 18-21, 2021},
publisher = {ACM},
isbn = {978-1-4503-7999-1},
}