Zhengqi Gao, Zihao Chen, Jun Tao 0001, Yangfeng Su, Dian Zhou, Xuan Zeng 0001. Bayesian Inference on Introduced General Region: An Efficient Parametric Yield Estimation Method for Integrated Circuits. In ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, Tokyo, Japan, January 18-21, 2021. pages 892-897, ACM, 2021. [doi]
Abstract is missing.