Feng Gao, John P. Hayes. Gate Sizing and V{t} Assignment for Active-Mode Leakage Power Reduction. In 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 11-13 October 2004, San Jose, CA, USA, Proceedings. pages 258-264, IEEE Computer Society, 2004. [doi]
Abstract is missing.