M. Gares, M. A. Belaïd, H. Maanane, M. Masmoudi, J. Marcon, K. Mourgues, Ph. Eudeline. Study of hot-carrier effects on power RF LDMOS device reliability. Microelectronics Reliability, 47(9-11):1394-1399, 2007. [doi]
@article{GaresBMMMME07,
title = {Study of hot-carrier effects on power RF LDMOS device reliability},
author = {M. Gares and M. A. Belaïd and H. Maanane and M. Masmoudi and J. Marcon and K. Mourgues and Ph. Eudeline},
year = {2007},
doi = {10.1016/j.microrel.2007.07.064},
url = {http://dx.doi.org/10.1016/j.microrel.2007.07.064},
tags = {reliability},
researchr = {https://researchr.org/publication/GaresBMMMME07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {9-11},
pages = {1394-1399},
}