Multi up-gradation software reliability growth model with faults of different severity

Amir Hossein Soleiman Garmabaki, Anu G. Aggarwal, P. K. Kapur. Multi up-gradation software reliability growth model with faults of different severity. In 2011 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, Singapore, December 6-9, 2011. pages 1539-1543, IEEE, 2011. [doi]

Authors

Amir Hossein Soleiman Garmabaki

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Anu G. Aggarwal

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P. K. Kapur

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