Amir Hossein Soleiman Garmabaki, Anu G. Aggarwal, P. K. Kapur. Multi up-gradation software reliability growth model with faults of different severity. In 2011 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, Singapore, December 6-9, 2011. pages 1539-1543, IEEE, 2011. [doi]
@inproceedings{GarmabakiAK11,
title = {Multi up-gradation software reliability growth model with faults of different severity},
author = {Amir Hossein Soleiman Garmabaki and Anu G. Aggarwal and P. K. Kapur},
year = {2011},
doi = {10.1109/IEEM.2011.6118175},
url = {http://dx.doi.org/10.1109/IEEM.2011.6118175},
researchr = {https://researchr.org/publication/GarmabakiAK11},
cites = {0},
citedby = {0},
pages = {1539-1543},
booktitle = {2011 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, Singapore, December 6-9, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0740-7},
}