Amir Hossein Soleiman Garmabaki, Anu G. Aggarwal, P. K. Kapur. Multi up-gradation software reliability growth model with faults of different severity. In 2011 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, Singapore, December 6-9, 2011. pages 1539-1543, IEEE, 2011. [doi]
Abstract is missing.