External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Tags

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Process dependence of BTI reliability in advanced HK MG stacks

X. Garros, M. Casse, M. Rafik, C. Fenouillet-Béranger, Gilles Reimbold, F. Martin, C. Wiemer, F. Boulanger. Process dependence of BTI reliability in advanced HK MG stacks. Microelectronics Reliability, 49(9-11):982-988, 2009. [doi]

Authors

X. Garros

This author has not been identified. Look up 'X. Garros' in Google

M. Casse

This author has not been identified. Look up 'M. Casse' in Google

M. Rafik

This author has not been identified. Look up 'M. Rafik' in Google

C. Fenouillet-Béranger

This author has not been identified. Look up 'C. Fenouillet-Béranger' in Google

Gilles Reimbold

This author has not been identified. Look up 'Gilles Reimbold' in Google

F. Martin

This author has not been identified. Look up 'F. Martin' in Google

C. Wiemer

This author has not been identified. Look up 'C. Wiemer' in Google

F. Boulanger

This author has not been identified. Look up 'F. Boulanger' in Google
runs on