X. Garros, M. Casse, M. Rafik, C. Fenouillet-Béranger, Gilles Reimbold, F. Martin, C. Wiemer, F. Boulanger. Process dependence of BTI reliability in advanced HK MG stacks. Microelectronics Reliability, 49(9-11):982-988, 2009. [doi]
@article{GarrosCRFRMWB09,
title = {Process dependence of BTI reliability in advanced HK MG stacks},
author = {X. Garros and M. Casse and M. Rafik and C. Fenouillet-Béranger and Gilles Reimbold and F. Martin and C. Wiemer and F. Boulanger},
year = {2009},
doi = {10.1016/j.microrel.2009.06.047},
url = {http://dx.doi.org/10.1016/j.microrel.2009.06.047},
tags = {C++, reliability},
researchr = {https://researchr.org/publication/GarrosCRFRMWB09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {9-11},
pages = {982-988},
}