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X. Garros, M. Casse, M. Rafik, C. Fenouillet-BĂ©ranger, Gilles Reimbold, F. Martin, C. Wiemer, F. Boulanger. Process dependence of BTI reliability in advanced HK MG stacks. Microelectronics Reliability, 49(9-11):982-988, 2009. [doi]