X. Garros, M. Casse, M. Rafik, C. Fenouillet-Béranger, Gilles Reimbold, F. Martin, C. Wiemer, F. Boulanger. Process dependence of BTI reliability in advanced HK MG stacks. Microelectronics Reliability, 49(9-11):982-988, 2009. [doi]
Abstract is missing.