Seyedeh Maryam Ghasemi, Sergej Meschkov, Jonas Krautter, Dennis R. E. Gnad, Mehdi B. Tahoori. Enabling In-Field Parametric Testing for RISC-V Cores. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 367-376, IEEE, 2023. [doi]
@inproceedings{GhasemiMKGT23-0, title = {Enabling In-Field Parametric Testing for RISC-V Cores}, author = {Seyedeh Maryam Ghasemi and Sergej Meschkov and Jonas Krautter and Dennis R. E. Gnad and Mehdi B. Tahoori}, year = {2023}, doi = {10.1109/ITC51656.2023.00054}, url = {https://doi.org/10.1109/ITC51656.2023.00054}, researchr = {https://researchr.org/publication/GhasemiMKGT23-0}, cites = {0}, citedby = {0}, pages = {367-376}, booktitle = {IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023}, publisher = {IEEE}, isbn = {979-8-3503-4325-0}, }