Seyedeh Maryam Ghasemi, Sergej Meschkov, Jonas Krautter, Dennis R. E. Gnad, Mehdi B. Tahoori. Enabling In-Field Parametric Testing for RISC-V Cores. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 367-376, IEEE, 2023. [doi]
Abstract is missing.