Valentin Gherman, Samuel Evain, Yannick Bonhomme. Memory reliability improvements based on maximized error-correcting codes. In 17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France. pages 1-6, IEEE Computer Society, 2012. [doi]
@inproceedings{GhermanEB12,
title = {Memory reliability improvements based on maximized error-correcting codes},
author = {Valentin Gherman and Samuel Evain and Yannick Bonhomme},
year = {2012},
doi = {10.1109/ETS.2012.6233018},
url = {http://dx.doi.org/10.1109/ETS.2012.6233018},
researchr = {https://researchr.org/publication/GhermanEB12},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-0697-3},
}