Error prediction based on concurrent self-test and reduced slack time

Valentin Gherman, J. Massas, Samuel Evain, Stéphane Chevobbe, Yannick Bonhomme. Error prediction based on concurrent self-test and reduced slack time. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 1626-1631, IEEE, 2011. [doi]

Authors

Valentin Gherman

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J. Massas

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Samuel Evain

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Stéphane Chevobbe

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Yannick Bonhomme

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