Valentin Gherman, J. Massas, Samuel Evain, Stéphane Chevobbe, Yannick Bonhomme. Error prediction based on concurrent self-test and reduced slack time. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 1626-1631, IEEE, 2011. [doi]
Abstract is missing.