Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch. A Test Vector Ordering Technique for Switching Activity Reduction During Test Operation. In 9th Great Lakes Symposium on VLSI (GLS-VLSI 99), 4-6 March 1999, Ann Arbor, MI, USA. pages 24, IEEE Computer Society, 1999. [doi]
Abstract is missing.