Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel. A BIST Structure to Test Delay Faults in a Scan Environment. In 7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore. pages 435-439, IEEE Computer Society, 1998. [doi]
Abstract is missing.