Patrick Girard, Christian Landrault, Serge Pravossoudovitch, B. Rodriguez. Diagnostic of path and gate delay faults in non-scan sequential circuits. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 380-386, IEEE Computer Society, 1995. [doi]
Abstract is missing.