Symbolic system level reliability analysis

Michael Glaß, Martin Lukasiewycz, Felix Reimann, Christian Haubelt, Jürgen Teich. Symbolic system level reliability analysis. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 185-189, IEEE, 2010. [doi]

Authors

Michael Glaß

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Martin Lukasiewycz

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Felix Reimann

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Christian Haubelt

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Jürgen Teich

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