Michael Glaß, Martin Lukasiewycz, Felix Reimann, Christian Haubelt, Jürgen Teich. Symbolic system level reliability analysis. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 185-189, IEEE, 2010. [doi]
No references recorded for this publication.
No citations of this publication recorded.