Michael Glaß, Martin Lukasiewycz, Felix Reimann, Christian Haubelt, Jürgen Teich. Symbolic system level reliability analysis. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 185-189, IEEE, 2010. [doi]
@inproceedings{GlassLRHT10,
title = {Symbolic system level reliability analysis},
author = {Michael Glaß and Martin Lukasiewycz and Felix Reimann and Christian Haubelt and Jürgen Teich},
year = {2010},
doi = {10.1109/ICCAD.2010.5654134},
url = {http://dx.doi.org/10.1109/ICCAD.2010.5654134},
tags = {analysis, reliability},
researchr = {https://researchr.org/publication/GlassLRHT10},
cites = {0},
citedby = {0},
pages = {185-189},
booktitle = {2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA},
publisher = {IEEE},
}