Clay S. Gloster Jr., Franc Brglez. Cellular scan test generation for sequential circuits. In Gerald Musgrave, editor, Proceedings of the conference on European design automation, EURO-DAC '92, Hamburg, Germany, September 7-10, 1992. pages 530-536, IEEE Computer Society Press, 1992. [doi]
@inproceedings{GlosterB92,
title = {Cellular scan test generation for sequential circuits},
author = {Clay S. Gloster Jr. and Franc Brglez},
year = {1992},
url = {http://dl.acm.org/citation.cfm?id=161804},
researchr = {https://researchr.org/publication/GlosterB92},
cites = {0},
citedby = {0},
pages = {530-536},
booktitle = {Proceedings of the conference on European design automation, EURO-DAC '92, Hamburg, Germany, September 7-10, 1992},
editor = {Gerald Musgrave},
publisher = {IEEE Computer Society Press},
isbn = {0-8186-2780-8},
}