D. Godfrey, D. Nirmal, L. Arivazhagan, D. Godwinraj, N. Mohan Kumar, Yulin Chen, Wenkuan Yeh. Current collapse degradation in GaN High Electron Mobility Transistor by virtual gate. Microelectronics Journal, 118:105293, 2021. [doi]
No references recorded for this publication.
No citations of this publication recorded.