Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
D. Godfrey, D. Nirmal, L. Arivazhagan, D. Godwinraj, N. Mohan Kumar, Yulin Chen, Wenkuan Yeh. Current collapse degradation in GaN High Electron Mobility Transistor by virtual gate. Microelectronics Journal, 118:105293, 2021. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Influence of Current Collapse in AlGaN/GaN High Electron Mobility TransistorsDeven G. Patanvariya, Sudhan Kumar, Lalat Indu Giri. icccnt 2019: 1-5 [doi]
The following publications are possibly variants of this publication: