Electrical modeling of the effect of beam profile for pulsed laser fault injection

C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart. Electrical modeling of the effect of beam profile for pulsed laser fault injection. Microelectronics Reliability, 49(9-11):1143-1147, 2009. [doi]

Authors

C. Godlewski

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Vincent Pouget

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Dean Lewis

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Mathieu Lisart

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