Data invalidation analysis for scan-based debug on multiple-clock system chips

Sandeep Kumar Goel, Bart Vermeulen. Data invalidation analysis for scan-based debug on multiple-clock system chips. In 7th European Test Workshop, ETW 2002, Corfu, Greece, May 26-29, 2002. pages 61-66, IEEE Computer Society, 2002. [doi]

Authors

Sandeep Kumar Goel

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Bart Vermeulen

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