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Sandeep Kumar Goel, Bart Vermeulen. Data invalidation analysis for scan-based debug on multiple-clock system chips. In 7th European Test Workshop, ETW 2002, Corfu, Greece, May 26-29, 2002. pages 61-66, IEEE Computer Society, 2002. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System ChipsSandeep Kumar Goel, Bart Vermeulen. et, 19(4):407-416, 2003. [doi] Hierarchical Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System ChipsSandeep Kumar Goel, Bart Vermeulen. itc 2002: 1103-1110 [doi]
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