Sandeep Kumar Goel, Bart Vermeulen. Data invalidation analysis for scan-based debug on multiple-clock system chips. In 7th European Test Workshop, ETW 2002, Corfu, Greece, May 26-29, 2002. pages 61-66, IEEE Computer Society, 2002. [doi]
@inproceedings{GoelV02-0,
title = {Data invalidation analysis for scan-based debug on multiple-clock system chips},
author = {Sandeep Kumar Goel and Bart Vermeulen},
year = {2002},
doi = {10.1109/ETW.2002.1029640},
url = {https://doi.org/10.1109/ETW.2002.1029640},
researchr = {https://researchr.org/publication/GoelV02-0},
cites = {0},
citedby = {0},
pages = {61-66},
booktitle = {7th European Test Workshop, ETW 2002, Corfu, Greece, May 26-29, 2002},
publisher = {IEEE Computer Society},
isbn = {0-7695-1715-3},
}