An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects

Andres F. Gomez, Víctor H. Champac. An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects. J. Electronic Testing, 35(1):87-100, 2019. [doi]

Authors

Andres F. Gomez

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Víctor H. Champac

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