Andres F. Gomez, Víctor H. Champac. An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects. J. Electronic Testing, 35(1):87-100, 2019. [doi]
@article{GomezC19,
title = {An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects},
author = {Andres F. Gomez and Víctor H. Champac},
year = {2019},
doi = {10.1007/s10836-019-05772-5},
url = {https://doi.org/10.1007/s10836-019-05772-5},
researchr = {https://researchr.org/publication/GomezC19},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {35},
number = {1},
pages = {87-100},
}