Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing - researchr publication authors

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Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici. Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 64-73, IEEE Computer Society, 2002. [doi]

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