Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici. Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 64-73, IEEE Computer Society, 2002. [doi]
@inproceedings{GonciariAN02:0,
title = {Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing},
author = {Paul Theo Gonciari and Bashir M. Al-Hashimi and Nicola Nicolici},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430064abs.htm},
tags = {testing, design},
researchr = {https://researchr.org/publication/GonciariAN02%3A0},
cites = {0},
citedby = {0},
pages = {64-73},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}