Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici. Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 64-73, IEEE Computer Society, 2002. [doi]
Abstract is missing.