Maziar Goudarzi, Tohru Ishihara. Row/column redundancy to reduce SRAM leakage in presence of random within-die delay variation. In Vijaykrishnan Narayanan, C. P. Ravikumar, Jörg Henkel, Ali Keshavarzi, Vojin G. Oklobdzija, Barry M. Pangrle, editors, Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008, Bangalore, India, August 11-13, 2008. pages 93-98, ACM, 2008. [doi]
Abstract is missing.