Ujjwal Guin, Tapan J. Chakraborty, Mohammad Tehranipoor. Functional Fmax test-time reduction using novel DFTs for circuit initialization. In 2013 IEEE 31st International Conference on Computer Design, ICCD 2013, Asheville, NC, USA, October 6-9, 2013. pages 1-6, IEEE, 2013. [doi]
@inproceedings{GuinCT13,
title = {Functional Fmax test-time reduction using novel DFTs for circuit initialization},
author = {Ujjwal Guin and Tapan J. Chakraborty and Mohammad Tehranipoor},
year = {2013},
doi = {10.1109/ICCD.2013.6657017},
url = {http://dx.doi.org/10.1109/ICCD.2013.6657017},
researchr = {https://researchr.org/publication/GuinCT13},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2013 IEEE 31st International Conference on Computer Design, ICCD 2013, Asheville, NC, USA, October 6-9, 2013},
publisher = {IEEE},
}