Rohini Gulve, Nihar Hage. On Generation of Delay Test with Capture Power Safety. In Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh, editors, VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers. Volume 711 of Communications in Computer and Information Science, pages 607-618, Springer, 2017. [doi]
Abstract is missing.