2 SRAM in 10nm FinFET technology with pulsed PMOS TVC and stepped-WL for low-voltage applications

Zheng Guo, Daeyeon Kim, Satyanand Nalam, Jami Wiedemer, Xiaofei Wang, Eric Karl. 2 SRAM in 10nm FinFET technology with pulsed PMOS TVC and stepped-WL for low-voltage applications. In 2018 IEEE International Solid-State Circuits Conference, ISSCC 2018, San Francisco, CA, USA, February 11-15, 2018. pages 196-198, IEEE, 2018. [doi]

@inproceedings{GuoKNWWK18,
  title = {2 SRAM in 10nm FinFET technology with pulsed PMOS TVC and stepped-WL for low-voltage applications},
  author = {Zheng Guo and Daeyeon Kim and Satyanand Nalam and Jami Wiedemer and Xiaofei Wang and Eric Karl},
  year = {2018},
  doi = {10.1109/ISSCC.2018.8310251},
  url = {https://doi.org/10.1109/ISSCC.2018.8310251},
  researchr = {https://researchr.org/publication/GuoKNWWK18},
  cites = {0},
  citedby = {0},
  pages = {196-198},
  booktitle = {2018 IEEE International Solid-State Circuits Conference, ISSCC 2018, San Francisco, CA, USA, February 11-15, 2018},
  publisher = {IEEE},
  isbn = {978-1-5090-4940-0},
}