Nanlin Guo, Fulin Peng, Jiahe Shi, Fan Yang 0001, Jun Tao 0001, Xuan Zeng 0001. Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation. ACM Trans. Design Autom. Electr. Syst., 29(1), January 2024. [doi]
@article{GuoPSYTZ24, title = {Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation}, author = {Nanlin Guo and Fulin Peng and Jiahe Shi and Fan Yang 0001 and Jun Tao 0001 and Xuan Zeng 0001}, year = {2024}, month = {January}, doi = {10.1145/3626321}, url = {https://doi.org/10.1145/3626321}, researchr = {https://researchr.org/publication/GuoPSYTZ24}, cites = {0}, citedby = {0}, journal = {ACM Trans. Design Autom. Electr. Syst.}, volume = {29}, number = {1}, }